Model:VERTEX 420
Category:Measuring microscope
Equipment Details:
Precision measurement system
Measurement speed: 1600
Measurement accuracy: measuring 1600 points, the maximum tolerance for statistical repeatability 3um, the minimum tolerance 1um
Reverse engineering 4: 1 used for 3D measurement of surface area
2 Export program settings facilitate output
5: 1 complete Chinese Windows2000, operating system
Specifications: US MICRO Vu upto 200mm-1500mm size dimensions
Measuring range stroke: X300 x Y300 x Z150mm X300 x Y300 x Z150 mm
XY Axis accuracy: U2 = 2.6 + L / 1750μm, U2 = 2.6 + L / 1750 micron
Z Axis precision: U1 = 3.0 + L / 150μm, U1 = 3.0 + L / 150 micron
Resolution optical foot resolution: 0.4μm, display 0.1um 0.4 microns, 0.1 micron
Velocity display movement speed: 500mm / s 500 mm / sec
XY-Axis acceleration: 250mm / s2 250 mm / sec
Z Axis acceleration: 100mm / s2 100 mm / sec
2 Stage material: Granite optic / magnification
Optical lens / magnification range: 6.5: 1
Programmable zoom lens / 20x-250x 6.5: 20-250 times
Environmental requirements: 20 ± 2 ° C temperature
Humidity temperature: 20 ± 2 ° C
Humidity: 30-80%
Welcome for inspection !
Thanks
Semimax Korea Corporation
sales@semimax.com
