The Cascade Microtech 12000-series probe systems allow you to access the full measurement range of your test instrumentation. Noise, leakage, stray capacitance and measurement settling times have been greatly reduced. Whatever the application: DC or RF device characterization, wafer-level reliability, e-test, modeling, or yield enhancement, the 12000-series probe stations assure best-in-the-world measurements.
EQUIPMENT CONFIGURATION & SPECIFICATIONS
Probe Station: Cascade Summit 12000-series semi-automatic, thermal wafer prober with MicroChamber(TM) and AttoGuard(TM) shielding
Thermal Wafer Chuck: Temptronic thermal wafer chuck (Gold) with
Thermal Controller: Temptronic TPO3000-2300-1; 115volts/60Hz/1Ph/20Amps
System Controller: 19-inch rack-mount computer; Windows(TM) 2000 operating system and Nucleus(TM) 2.7 prober control software.
Microscope: A_zoom Mitutoyo compound microscope with trinocular head, includes 10X eyepieces and (qty 1) Mitutoyo MPlan APO 10X objective lens. Additional microscope lenses are sold separately.
Welcome for inspection
Semimax Korea Corporation
sales@semimax.com
82-31-456-9030
No comments:
Post a Comment